dynamic current造句
例句与造句
- Class dynamic current : 80ka
最大等级动稳定电流： 80ka - Rated dynamic current
额定动态电流 - Ated dynamic current
额定动态电流 - Dynamic current monitor reflects transient loading current instantly to judge the faulty parts of mobile circuit board easily
动态电流监测器能瞬时反映出负载跳变状态,更容易判断手机板的故障部份。 - Spice experiments were done to simulate the dynamic currents of both the fault circuits and fault free circuits under the function of testing pairs
对于这些测试向量对，通过spice软件模拟了故障电路和无故障电路在测试向量对作用下的动态电流。 - It's difficult to find dynamic current in a sentence. 用dynamic current造句挺难的
- If you need a programmable dynamic current source , find out about operational transconductance amps . most of the problem is figuring out when you need a programmable dynamic current source
如果需要一个可编程的动态电流源，找出运算跨导的放大器，大部分的问题就明白了。 - In this way , a simple and direct relation was build up between logical transitions and dynamic current , which makes possible iddt testing pattern generation on logical level
该方法在电路逻辑跳变与电路动态电流之间建立了一种简单直观的关系，使得动态电流测试产生能够在逻辑级上得以实现。 - Therefore , as an enhancement of traditional methods of testing , the dynamic current ( iddt ) testing is being paid close attention to and studied by the research field and the industrial field progressively
因而这种方法作为传统测试方法的一个补充,正逐步受到研究领域和工业领域的关注和研究。 - The simulation results showed that there are some differences between the waveforms of currents . by comparing the average dynamic currents , these test pairs can detect some faults
模拟结果表明，故障电路和无故障电路的动态电流产生了一定的差别，通过比较两者的平均动态电流，这些测试向量对能有效的检测某些故障。 - The dissertation studied the topology of system configuration , performed the modeling and matlab / pspice based simulation . the focus was put on the problems and their solutions that may be related to the static and dynamic current sharing of parallel connected dc power modules
进行了系统结构的设计，并联系统的建模，以及运用matlab 、 pspice软件的仿真，关注的中心是对并联直流电源的静态与动态均流等可能出现的问题进行分析并找出解决方案。 - For the convenience of test , varied circuit chip defects caused by the production process are abstracted as all kinds of models . at present the commonly used fault models mainly consist of stuck - at fault , stuck - open fault , bridge fault , store fault , delay fault , etc . testing methods based on voltage testing mainly aim at stuck - at fault model and have also obtained satisfactory result in research for many years . bridge fault is tested easily by quiescent power supply current ( iddq ) testing method . in regard to stuck - open fault that is difficult to testd by quiescent power supply current ( iddq ) and voltage testing , it can is tested by the dynamic current ( iddt ) testing
为了便于测试,我们将生产过程中集成电路出现的多种多样的缺陷抽象为各种模型。目前常用的故障模型主要有:固定故障,开路故障,桥接故障,存储故障,时滞故障等。电压测试主要针对固定型故障模型,多年的研究也取得了令人满意的结果; cmos电路中的桥接故障则宜用稳态电流测试方法( iddq )测试;对于电压和稳态电流难以测试的开路故障,可以使用瞬态电流测试( iddt )的方法进行测试。 - At present testing method based on current testing has become an important cmos digital integrated circuit testing method which has been accepted widely . in order to improve the fault coverage of the testing to meet the demands of people , the dynamic current ( iddt ) testing was proposed to detect some faults that cannot be detected by other testing methods in the middle 1990 ’ s
90年代中期,人们提出了瞬态电流测试方法( iddt ) ,以便发现一些其他测试方法所不能发现的故障,进一步从总体上提高测试的故障覆盖率,满足人们对高性能集成电路的需要。